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July 27, 2017CRC PressApril 29, 2015CRC PressJuly 28, 2017CRC PressWhere the content of the eBook requires a specific layout, or contains maths or other special characters, the eBook will be available in PDF (PBK) format, which cannot be reflowed. For both formats the functionality available will depend on how you access the ebook (via Bookshelf Online in your browser or via the Bookshelf app on your PC or mobile device). Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology. After ten years of research and educational works at Yamanashi University, Kofu, Japan, he moved to Tokyo University of Agriculture and Technology, Japan, where he was professor in the Department of Mechanical Systems Engineering for 25 years. After retirement from the university, he worked in industry for three years, and then moved to Saitama Medical University, Japan to explore medical and biomedical fields using optical techniques. Currently he is director at Non-Profit Organization 3D Associates, Yokohama, Japan, and professor emeritus at Tokyo University of Agriculture and Technology. The discussion of optical metrology techniques focuses on the practical implementation and instrumentation rather than the science and research areas that would be beyond the scope of those without specific background in each area. It is written at a level that could be understood by an operator to better guide the use of commercial optical metrology instrumentation. And the contributors are all well known in their particular fields.To learn how to manage your cookie settings, please see our. Breadcrumbs Section.

basic calculus from archimedes to newton to its role in science textbooks in mathematical sciences.

Click here to navigate to respective pages. Book Book Handbook of Optical Metrology DOI link for Handbook of Optical Metrology Handbook of Optical Metrology book Principles and Applications Handbook of Optical Metrology DOI link for Handbook of Optical Metrology Handbook of Optical Metrology book Principles and Applications Edited By Toru Yoshizawa Edition 2nd Edition First Published 2015 eBook Published 31 January 2017 Pub.Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology. Breadcrumbs Section. Click here to navigate to respective pages. Book Book Handbook of Optical Metrology DOI link for Handbook of Optical Metrology Handbook of Optical Metrology book Principles and Applications Handbook of Optical Metrology DOI link for Handbook of Optical Metrology Handbook of Optical Metrology book Principles and Applications Edited By Toru Yoshizawa Edition 2nd Edition First Published 2015 eBook Published 31 January 2017 Pub.Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology. Download citation Copy link Link copied Copy link Link copied Citations (12) Abstract Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology.

Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moire metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology. This is a vital factor as the deformation of the polymer or composite should be uniform in all directions. In particular the demand to increase production rates indicates that traditional manual methods are no longer sufficient, and automated solutions must be sought. This typically leads to automated forming processes where there are a limited number of effective options. The need for forming typically arises from the inability of layup methods to produce complex geometries of structural components. This paper reviews the current state of the art in automated forming processes, their limitations and variables that affect performance in the production of large scale components. In particular the paper will focus on the application of force and heat within secondary forming processes. It will then review the effects of these variables against the structure of the required composite component and identify viability of the technology.

Through this, an understanding of the key criteria involved in the forming of composite aerospace components can be utilised to better inform improved manufacturing processes and capabilities. View Show abstract. To obtain a representative surface area, the stitching method ( Figure 1c) processes with 20 overlap (135 topographical maps with 640 ? 480-pixel resolution of each individual map; see (Table 1)).. A Multiscale Topographical Analysis Based on Morphological Information: The HEVC Multiscale Decomposition Article Full-text available Dec 2020 Tarek Eseholi Francois-Xavier Coudoux Patrick Corlay Maxence Bigerelle In this paper, we evaluate the effect of scale analysis as well as the filtering process on the performances of an original compressed-domain classifier in the field of material surface topographies classification. Each surface profile is multiscale analyzed by using a Gaussian Filter analyzing method to be decomposed into three multiscale filtered image types: Low-pass (LP), Band-pass (BP), and High-pass (HP) filtered versions, respectively. The complete set of filtered image data constitutes the collected database. First, the images are lossless compressed using the state-of-the art High-efficiency video coding (HEVC) video coding standard. Then, the Intra-Prediction Modes Histogram (IPHM) feature descriptor is computed directly in the compressed domain from each HEVC compressed image. Finally, we apply the IPHM feature descriptors as an input of a Support Vector Machine (SVM) classifier. SVM is introduced here to strengthen the performances of the proposed classification system thanks to the powerful properties of machine learning tools. We evaluate the proposed solution we called “HEVC Multiscale Decomposition” (HEVC-MD) on a huge database of nearly 42,000 multiscale topographic images. A simple preliminary version of the algorithm reaches an accuracy of 52.

We increase this accuracy to 70 by using the multiscale analysis of the high-frequency range HP filtered image data sets. Finally, we verify that considering only the highest-scale analysis of low-frequency range LP was more appropriate for classifying our six surface topographies with an accuracy of up to 81. To compare these new topographical descriptors to those conventionally used, SVM is applied on a set of 34 roughness parameters defined on the International Standard GPS ISO 25178 (Geometrical Product Specification), and one obtains accuracies of 38, 52, 65, and 57 respectively for Sa, multiscale Sa, 34 roughness parameters, and multiscale ones. Compared to conventional roughness descriptors, the HEVC-MD descriptors increase surfaces discrimination from 65 to 81. View Show abstract Introduction of All-Around 3D Modeling Methods for Investigation of Plants Article May 2021 Nobuo Kochi Sachiko Isobe Atsushi Hayashi Takanari Tanabata Digital image phenotyping has become popular in plant research. Plants are complex in shape, and occlusion can often occur. Three-dimensional (3D) data are expected to measure the morphological traits of plants with higher accuracy. Therefore, it is difficult to construct an accurate 3D model by applying methods developed for industrial materials and architecture. Here, we review noncontact and all-around 3D modeling and configuration of camera systems to measure the morphological traits of plants in terms of system composition, accuracy, cost, and usability. Typical noncontact 3D measurement methods can be roughly classified into active and passive methods. We describe their advantages and disadvantages. While various fields are adopting 3D model construction, nonexpert users struggle to use them and end up selecting inadequate methods, which lead to model failure. We hope that this review will help users who are considering starting to construct and measure 3D models.

View Show abstract Investigation of Low Temperature Deformation Measurement Problem by the Contact Holographic Interferometers Chapter Jan 2021 Sergey Gerasimov Victor Tikhomirov The materials currently used in modern structures do dramatically change their mechanical properties under the influence of low operating temperatures. One of the factors affecting the breakdown of various structural elements at low temperatures, is the placement of the stress concentrations. The existing analytical design schemes cannot always correctly take into account the material mechanical properties changes caused by the temperature decrease. This technique is used to determine in-plane and out-of-plane displacements of tested object. If a hologram is recorded at metallized grating surface it restores information peculiar to some optical methods: holographic interferometry, speckle photography, holographic moire and mirror-optical method. For the interpretation of interference patterns new simple analytical equations are obtained. Contact holographic interferometers are used effectively to solve some elasto-plastic deformation measurement problems of isotropic and polycristalline materials. It is specially designed to permit the accurate measurement of the in-plane component of strain in the immediate vicinity of stress concentrators in plates. View Show abstract Influence and Effects of Artificial Light After Dark and Light Pollution Chapter Jan 2021 Emlyn Etienne Goronczy Cinzano et al. (2001) illustrate the intensity with which artificial light is applied in and around cities after dark. In the study carried out between 1996 and 1997, twenty-eight photographs of the earth were taken and assembled into a map. Interfering factors such as overexposure, fires or unclear atmospheres were removed from the images so that only images of clear skies were processed in the end result (Fig. 3.1).

View Show abstract Waviness measurement system for implementing in laser destructuring by remelting of metal surfaces Article Apr 2020 Oleg M. Oreshkin Viacheslav A. Khloponin Daniil Panov D. V. Ushakov To increase the efficiency of laser destructuring, data on the waviness of the part associated with the coordinate system of the laser processing machine are required. At present, there are no non-contact profile measurement systems on the market that meet all the requirements that apply to a system for measuring the surface profile of parts and are determined by the parameters of the laser destructuring. The developed measurement system will allow to take waviness measurement directly at the laser processing machine, which will significantly reduce the complexity of the process. A prototype of a system for measuring the surface profile (waviness) has been created inaccordance with the measurement requirements for a laser processing machine. The scheme and principle of operation of the system for measuring the waviness of the installation for laser destructuring are described. In measurements, the triangulation method was used. A prototype allows to measure the profile of the of the surface waviness with a spatial wavelength of 2 mm with an accuracy of 3,78 ?m in the vertical direction and 13,8 ?m in the lateral direction. The accuracy of the prototype was verified using the standard method of stylus profilometry. The waviness profile obtained with a developed system can be used to modulate the amplitude of the laser radiation power in the laser destructuring. With the development of optical technology, wavelength-tuned phase-shifting interferometry has been widely used for measuring the surface profiles of optical components based on the high accuracy of this technique. However, coupling errors caused by higher harmonics and phase-shift errors may lead to systematic errors in the calculated phase.
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In this research, to suppress coupling errors effectively, we propose an 8N-7 phase-shifting algorithm consisting of a novel polynomial window function and discrete Fourier transform. By locating eight multiple roots on the characteristic diagram, the polynomial window function of the proposed algorithm is derived based on the theory of characteristic polynomials. The characteristic polynomial of the 8N-7 algorithm is estimated based on a Fourier representation. Phase errors are discussed and compared to the errors in other algorithms. The results indicate that the 8N-7 algorithm has the smallest phase error among the compared algorithms and can compensate for up to sixth-order nonlinearity in phase measurements. Finally, the proposed algorithm was applied to profile the surface of a silicon wafer. The results revealed that the standard deviation across 20 experiments was 3.231 nm, which is much smaller than the standard deviations of conventional phase-shifting algorithms. View Show abstract Einfluss und Auswirkungen des nachtlichen Kunstlichts und der Lichtverschmutzung: Analyse, Auswirkungen und Losungsansatze Chapter Jan 2018 Emlyn Etienne Goronczy Cinzano et al. (2001) veranschaulichen, mit welcher Intensitat die Nachte mit Kunstlicht aufgehellt werden. View Show abstract Light source selection for a solar simulator for thermal applications: A review Article Apr 2018 RENEW SUST ENERG REV Mohamed Tawfik Xavier Tonnellier Christopher Sansom Solar simulators are used to test components and systems under controlled and repeatable conditions, often in locations with unsuitable insolation for outdoor testing. The growth in renewable energy generation has led to an increased need to develop, manufacture and test components and subsystems for solar thermal, photovoltaic (PV), and concentrating optics for both thermal and electrical solar applications. At the heart of any solar simulator is the light source itself.

This paper reviews the light sources available for both low and high-flux solar simulators used for thermal applications. Criteria considered include a comparison of the lamp wavelength spectrum with the solar spectrum, lamp intensity, cost, stability, durability, and any hazards associated with use. Four main lamp types are discussed in detail, namely argon arc, the metal halide, tungsten halogen lamp, and xenon arc lamps. In addition to describing the characteristics of each lamp type, the popularity of usage of each type over time is also indicated. This is followed by guidelines for selecting a suitable lamp, depending on the requirements of the user and the criteria applied for selection. The appropriate international standards are also addressed and discussed. The review shows that metal halide and xenon arc lamps predominate, since both provide a good spectral match to the solar output. The xenon lamp provides a more intense and stable output, but has the disadvantages of being a high-pressure component, requiring infrared filtering, and the need of a more complex and expensive power supply. As a result, many new solar simulators prefer metal halide lamps. The increasing use of these materials creates a demand for nondestructive verification of various properties or specifications, determination of structural integrity, or prediction of service-life. On the other hand, development of new nondestructive test methods, improved sensitivity, or faster data acquisition and analysis may allow for nondestructive testing applications that hitherto did not seem feasible or economical. View Show abstract Phase retrieval of microscope objects using the Wavelet-Gabor transform method from holographic filters Article Sep 2014 Proceedings of SPIE Martin Hernandez-Romo Alfonso Padilla-vivanco Myung K Kim Carina Toxqui-Quitl An analysis of an optical-digital system based on the architecture of the Mach-Zehnder interferometer for recording holographic filters is presented.

The holographic recording system makes use of one microscope objective in each interferometer arm. Moreover, the Gabor Wavelet Transform is implemented for the holographic reconstruction stage. The samples studied of this research are selected in order to test the retrieval algorithm and to characterize the resolution of the holographic recording system. In this last step, some sections of an USAF1951 resolution chart are used. These samples allow us to study the features of lighting in the recorded system. Additionally, some organic samples are used to proven the capabilities of the method because biological samples have much complex morphological composition than others. With this in mind, we can verify the frequencies recovered with each of the settings set in the retrieval method. Experimental results are presented. View Show abstract ResearchGate has not been able to resolve any references for this publication. This device, based on conoscopic holography, is able to obtain a distance profile of a target in a single shot, works at long distance standoff (700 to 1200 mm), and still keeps good resolution (under 0.2 mm) with a very easy and reliable setup. The second part of the work focuses on a real example of this technology applied in an on-line inspection system in steel continuous casting funded by the European Coal and Steel Community, and which is currently working in the Aceralia LDA steelmaking factory in Asturias (Spain). Read more Book Full-text available Optical Metrology for Microsystems. A view of optoelectronics microsystems in optical communication. January 2019 Luis Acevedo The book will explain optoelectronics design, manufacturing and testing for optical interconnets, optical metrology and biomedical sensors. A technical journey from bulky Interferometry to optical MEMS will be presented.

The robustness of this strategy increased when analyzing the SR data with a Fourier transform (FT) based algorithm which combines FT-based filtering around the thickness of interest with spectral matching to improve measurement performance. Read more Article Phase estimation methods and their application to holographic interferometry January 2006 Rajesh Langoju Phase of the interference fringe pattern is known to convey important information in optical metrology. The measurement process is also very sensitive to other systematic and random sources of errors that we may encounter during the experiment. To address these concerns, several algorithms have been proposed, but they have met with limited success as they allow only a limited number of error sources influencing the measurements to be minimized. The problem is exacerbated further when it comes to accommodating multiple PZTs in an optical configuration, such as, in holographic moire. Incorporation of two PZTs is essential for the simultaneous estimation of multiple phase information in holographic moire, such as, those corresponding to out-of-plane and in-plane displacement components. Recent introduction of high resolution methods in holographic moire for the estimation of multiple phase information has been found to exhibit constraints while operating outside the linear region of the response of the piezoelectric device to the applied voltage. This research thesis thus addresses a significant issue of measuring phase efficiently in the presence of nonlinear response of the PZT to the applied voltage and at the same time contributes to compensating several other systematic sources of errors. For this we have designed methods based on signal processing approaches which have reputation of robust performers in the presence of random noise. The thesis presents simulation and experimental verification of the proposed methods to show their feasibility in practical situations.

To the best of our knowledge, this is one of the first times that an attempt has been made to provide a robust signal processing approach for the estimation of multiple phase information in a topic of extreme significance such as that of optical metrology. La phase des franges d'interference transporte d'importantes informations en metrologie optique. Typiquement, la mesure de la phase par des techniques temporelles s'effectue en incorporant un dispositif piezoelectrique (PZT) a un bras de l'interferometre pour decaler la phase relative des deux rayons d'interference. Bien que la precision de la mesure de la phase effectuee avec cette technique atteigne un centime de la longueur d'onde, l'erreur due au dispositif de decalage de phase lui-meme constitue une des limitations potentielles de la qualite des mesures. Le processus de mesure est egalement tres sensible a toutes les autres sources d'erreurs, qu'elles soient systematiques ou aleatoires, qui peuvent apparaitre lors de l'experimentation. Divers algorithmes ont ete proposes pour palier a ces inconvenients, avec des succes limites car ils ne permettent de minimiser qu'un nombre restreint des sources d'erreurs qui perturbent les mesures. Le probleme est encore exacerbe lorsque plusieurs PZT interviennent dans la configuration optique, comme dans le moire holographique. L'utilisation de deux PZT est essentielle pour l'estimation simultanee de l'information multiple des phases dans le moire holographique, comme celles correspondant aux composantes hors du plan et dans le plan des deplacements. L'introduction recente de methodes a haute resolution en moire holographique pour l'estimation de l'information multiple des phases a montre ses limites lorsqu'il faut operer en dehors de la plage lineaire de travail des dispositifs piezoelectriques.

Cette these concerne donc un aspect essentiel pour une mesure performante des phases en presence de reponse non lineaire des PZT et contribue en meme temps a la compensation de diverses sources d'erreurs systematiques. Dans ce but, des methodes basees sur le traitement du signal, approche connue pour sa robustesse en presence de bruit aleatoire, ont ete developpees. La these presente des simulations et des verifications experimentales des methodes proposees pour montrer leur applicabilite dans des situations concretes. A notre connaissance, c'est une des toutes premieres fois que l'approche robuste du traitement du signal est appliquee pour l'estimation de l'information multiple des phases dans un domaine de premiere importance comme celui de la metrologie optique. Read more Discover the world's research Join ResearchGate to find the people and research you need to help your work. Join for free ResearchGate iOS App Get it from the App Store now. Install Keep up with your stats and more Access scientific knowledge from anywhere or Discover by subject area Recruit researchers Join for free Login Email Tip: Most researchers use their institutional email address as their ResearchGate login Password Forgot password. Keep me logged in Log in or Continue with LinkedIn Continue with Google Welcome back. Keep me logged in Log in or Continue with LinkedIn Continue with Google No account. All rights reserved. Terms Privacy Copyright Imprint.

Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moire metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology. EditionThe third section comprises moreNo portion of this article can be reproduced without the express written permission from the copyright holder.All rights reserved. Next Article: Radiotherapy Treatment Planning: Linear-Quadratic Radiobiology. See how Impactio can help you with your research career. Start All rights reserved. About usAll rights reserved. X Edit a publication Upload the pdf file to automatically fill out the information. Drop your file here, orDelete Photo Change Photo Save. We can't connect to the server for this app or website at this time. There might be too much traffic or a configuration error. Try again later, or contact the app or website owner. Explore ProQuest Full Text Scholarly Journals Handbook of Optical Metrology: Principles and Applications, 2nd Edition: Book Review Yurish, Sergey Y. Save up to 80 by choosing the eTextbook option for ISBN: 9781466573611, 1466573619.

The print version of this textbook is ISBN: 9781138893634, 1138893633.Save up to 80 by choosing the eTextbook option for ISBN: 9781466573611, 1466573619. The print version of this textbook is ISBN: 9781138893634, 1138893633. Restrictions apply. Try it free About This Item We aim to show you accurate product information. Manufacturers,See our disclaimer Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moire metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters--nearly 100 pages--on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology. Handbook of Optical Metrology: Principles and Applications, Second Edition (Paperback) Specifications Language English Publisher Taylor and Francis Book Format Paperback Number of Pages 919 Author Toru Yoshizawa Title Handbook of Optical Metrology ISBN-13 9781138893634 Publication Date July, 2017 ISBN-10 1138893633 Customer Reviews Write a review Be the first to review this item.